FISCHER COULOSCOPE® CMS
Typical values measured with FISCHERSCOPE® X-RAY XDV®-μ, 10 x 30sec
The X-ray beam of the FISCHERSCOPE® X-RAY XDV®-μ, equipped with poly-capillary optics and a silicon drift detector (SDD), can be focused down to measuring spot sizes as small as 20μm while still yielding very high count rates, guaranteeing outstanding repeatability and precision.
If accurately determining the composition of solder bumps – not only to verify lead-free technology – is important to you, the FISCHERSCOPE® X-RAY XDV-µ®, with its extremely small measuring spot, is the ideal instrument. For further information please contact your local FISCHER representative.